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[报告] Ag迁移致集成电路输出异常失效分析 [复制链接]

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1.案例背景‘¦LPIf;!õŽbbs.3c3t.comïÆyp/9®{2ë
     某功能模块在用户端出现功能失效,经返厂检修,发现该模块上的一片IC输出异常,经更换IC后,功能模块恢复正常。‘¦LPIf;!õŽbbs.3c3t.comïÆyp/9®{2ë
‘¦LPIf;!õŽbbs.3c3t.comïÆyp/9®{2ë
2.分析方法简述‘¦LPIf;!õŽbbs.3c3t.comïÆyp/9®{2ë
     对样品进行外观观察,未发现明显异常。‘¦LPIf;!õŽbbs.3c3t.comïÆyp/9®{2ë
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     经X-RAY无损检测,未发现明显异常。‘¦LPIf;!õŽbbs.3c3t.comïÆyp/9®{2ë

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     通过C-SAM扫描发现了IC内部存在分层现象。‘¦LPIf;!õŽbbs.3c3t.comïÆyp/9®{2ë

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图5.NG样品C-SAM图片‘¦LPIf;!õŽbbs.3c3t.comïÆyp/9®{2ë

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‘¦LPIf;!õŽbbs.3c3t.comïÆyp/9®{2ë
     通过IV曲线测试,发现引脚间存在漏电通道。‘¦LPIf;!õŽbbs.3c3t.comïÆyp/9®{2ë
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图6.NG样品IV曲线图‘¦LPIf;!õŽbbs.3c3t.comïÆyp/9®{2ë

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DE-CAP后,利用SEM/EDS进行分析,确认了引脚间存在银迁移问题。‘¦LPIf;!õŽbbs.3c3t.comïÆyp/9®{2ë
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表1.开封后的NG样品内部EDS测试结果(Wt%)‘¦LPIf;!õŽbbs.3c3t.comïÆyp/9®{2ë
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3.结论‘¦LPIf;!õŽbbs.3c3t.comïÆyp/9®{2ë

‘¦LPIf;!õŽbbs.3c3t.comïÆyp/9®{2ë
IC内部存在分层,由于水汽的入侵,加上集成电路各引脚之间存在电位差,导致了引脚间的银迁移,从而在引脚间形成微导通电路,致IC输出异常。‘¦LPIf;!õŽbbs.3c3t.comïÆyp/9®{2ë

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4.参考标准‘¦LPIf;!õŽbbs.3c3t.comïÆyp/9®{2ë

     GJB 548B-2005 微电子器件失效分析程序-方法5003。‘¦LPIf;!õŽbbs.3c3t.comïÆyp/9®{2ë

‘¦LPIf;!õŽbbs.3c3t.comïÆyp/9®{2ë

     IPC-TM-650 2.1.1-2004手动微切片法。‘¦LPIf;!õŽbbs.3c3t.comïÆyp/9®{2ë

‘¦LPIf;!õŽbbs.3c3t.comïÆyp/9®{2ë

     GB/T 17359-2012 电子探针和扫描电镜X射线能谱定量分析通则。‘¦LPIf;!õŽbbs.3c3t.comïÆyp/9®{2ë

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这是做什么的‘¦LPIf;!õŽbbs.3c3t.comïÆyp/9®{2ë
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快来看看了‘¦LPIf;!õŽbbs.3c3t.comïÆyp/9®{2ë
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