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meixinjiance
- 技术员
- 26
- 78
- 2015-03-11
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发表于 2015-03-16 10:47
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表面异物分析目的：y/RG#=Cbbs.3c3t.com+ÔnÇø,当材料及零部件表面出现未知物质，不能确定其成分及来源时，可以通过对异物进行微观形貌观察和成分分析进行判断。y/RG#=Cbbs.3c3t.com+ÔnÇø,分析方法：y/RG#=Cbbs.3c3t.com+ÔnÇø,根据样品实际情况，以下分析方法可供选用。y/RG#=Cbbs.3c3t.com+ÔnÇø,y/RG#=Cbbs.3c3t.com+ÔnÇø,仪器名称y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 信号检测y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 元素测定y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 检测限y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 深度分辨率y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 适用范围y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 扫描电子显微镜（SEM）y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 二次及背向散射电子&X射线y/RG#=Cbbs.3c3t.com+ÔnÇø,
| B-U (EDS mode)y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 0.1 - 1 at%y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 0.5 - 3 µm (EDS)y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 高辨析率成像y/RG#=Cbbs.3c3t.com+ÔnÇø,
元素微观分析及颗粒特征化描述y/RG#=Cbbs.3c3t.com+ÔnÇø,
| X射线能谱仪（EDS）y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 二次背向散射电子&X射线y/RG#=Cbbs.3c3t.com+ÔnÇø,
| B-Uy/RG#=Cbbs.3c3t.com+ÔnÇø,
| 0.1 – 1 at%y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 0.5 – 3 μmy/RG#=Cbbs.3c3t.com+ÔnÇø,
| 小面积上的成像与元素组成；缺陷处元素的识别/绘图；颗粒分析（>300nm）y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 显微红外显微镜（FTIR）y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 红外线吸收y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 分子群y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 0.1 - 1 wt%y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 0.1 - 2.5 µmy/RG#=Cbbs.3c3t.com+ÔnÇø,
| 污染物分析中识别有机化合物的分子结构y/RG#=Cbbs.3c3t.com+ÔnÇø,
识别有机颗粒、粉末、薄膜及液体（材料识别）y/RG#=Cbbs.3c3t.com+ÔnÇø,
量化硅中氧和氢以及氮化硅晶圆中的氢 （Si-H vs. N-H）y/RG#=Cbbs.3c3t.com+ÔnÇø,
污染物分析（析取、除过气的产品，残余物）y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 拉曼光谱（Raman）y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 拉曼散射y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 化学及分子键联资料y/RG#=Cbbs.3c3t.com+ÔnÇø,
| >=1 wt%y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 共焦模式y/RG#=Cbbs.3c3t.com+ÔnÇø,
1到5 µmy/RG#=Cbbs.3c3t.com+ÔnÇø,
| 为污染物分析、材料分类以及张力力测量而识别有机和无机化合物的分子结构y/RG#=Cbbs.3c3t.com+ÔnÇø,
拉曼，碳层特征 （石墨、金刚石 ）y/RG#=Cbbs.3c3t.com+ÔnÇø,
非共价键联压焊(复合体、金属键联)y/RG#=Cbbs.3c3t.com+ÔnÇø,
定位(随机v. 有组织的结构)y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 俄歇电子能谱仪（AES）y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 来自表面附近的Auger电子y/RG#=Cbbs.3c3t.com+ÔnÇø,
| Li-Uy/RG#=Cbbs.3c3t.com+ÔnÇø,
| 0.1-1%亚单层y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 20 – 200 Ǻ侧面分布模式y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 缺陷分析；颗粒分析；表面分析；小面积深度剖面；薄膜成分分析y/RG#=Cbbs.3c3t.com+ÔnÇø,
| X射线光电子能谱仪（XPS）y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 来自表面原子附近的光电子y/RG#=Cbbs.3c3t.com+ÔnÇø,
| Li-U化学键联信息y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 0.01 - 1 at% sub-monolayery/RG#=Cbbs.3c3t.com+ÔnÇø,
| 20 - 200 Å（剖析模式）y/RG#=Cbbs.3c3t.com+ÔnÇø,
10 - 100 Å (表面分析）y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 有机材料、无机材料、污点、残留物的表面分析y/RG#=Cbbs.3c3t.com+ÔnÇø,
测量表面成分及化学状态信息y/RG#=Cbbs.3c3t.com+ÔnÇø,
薄膜成份的深度剖面y/RG#=Cbbs.3c3t.com+ÔnÇø,
硅 氧氮化物厚度和测量剂量y/RG#=Cbbs.3c3t.com+ÔnÇø,
薄膜氧化物厚度测量（SiO2, Al2O3 等.）y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 飞行时间二次离子质谱仪（TOF-SIMS）y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 分子和元素种类y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 整个周期表，加分子种类y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 107 - 1010at/cm2 sub-monolayery/RG#=Cbbs.3c3t.com+ÔnÇø,
| 1 - 3 monolayers (Static mode)y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 有机材料和无机材料的表面微量分析y/RG#=Cbbs.3c3t.com+ÔnÇø,
来自表面的大量光谱y/RG#=Cbbs.3c3t.com+ÔnÇø,
表面离子成像y/RG#=Cbbs.3c3t.com+ÔnÇø,
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y/RG#=Cbbs.3c3t.com+ÔnÇø,部分案例图片：y/RG#=Cbbs.3c3t.com+ÔnÇø,y/RG#=Cbbs.3c3t.com+ÔnÇø, y/RG#=Cbbs.3c3t.com+ÔnÇø,
|  y/RG#=Cbbs.3c3t.com+ÔnÇø,
y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 塑料断口红色颗粒物分析y/RG#=Cbbs.3c3t.com+ÔnÇø, y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 塑料表面白色粉末成分分析y/RG#=Cbbs.3c3t.com+ÔnÇø, y/RG#=Cbbs.3c3t.com+ÔnÇø,
|  y/RG#=Cbbs.3c3t.com+ÔnÇø,
|  y/RG#=Cbbs.3c3t.com+ÔnÇø,
y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 连接端子pin针表面异物分析y/RG#=Cbbs.3c3t.com+ÔnÇø, y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 金手指端部表面异物分析y/RG#=Cbbs.3c3t.com+ÔnÇø, y/RG#=Cbbs.3c3t.com+ÔnÇø,
|  y/RG#=Cbbs.3c3t.com+ÔnÇø,
|  y/RG#=Cbbs.3c3t.com+ÔnÇø,
y/RG#=Cbbs.3c3t.com+ÔnÇø,
| 镀金管脚表面异物分析y/RG#=Cbbs.3c3t.com+ÔnÇø, y/RG#=Cbbs.3c3t.com+ÔnÇø,
|  y/RG#=Cbbs.3c3t.com+ÔnÇø,
|  y/RG#=Cbbs.3c3t.com+ÔnÇø,
y/RG#=Cbbs.3c3t.com+ÔnÇø,
| PCB表面异物成分分析y/RG#=Cbbs.3c3t.com+ÔnÇø, y/RG#=Cbbs.3c3t.com+ÔnÇø,
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y/RG#=Cbbs.3c3t.com+ÔnÇø,
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