仪器名称Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 信号检测Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 元素测定Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 检测限Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 深度分辨率Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 适用范围Éxx%µýÍÇbbs.3c3t.com\Ö}.
|
扫描电子显微镜（SEM）Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 二次及背向散射电子&X射线Éxx%µýÍÇbbs.3c3t.com\Ö}.
| B-U (EDS mode)Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 0.1 - 1 at%Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 0.5 - 3 µm (EDS)Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 高辨析率成像Éxx%µýÍÇbbs.3c3t.com\Ö}.
元素微观分析及颗粒特征化描述Éxx%µýÍÇbbs.3c3t.com\Ö}.
|
X射线能谱仪（EDS）Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 二次背向散射电子&X射线Éxx%µýÍÇbbs.3c3t.com\Ö}.
| B-UÉxx%µýÍÇbbs.3c3t.com\Ö}.
| 0.1 – 1 at%Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 0.5 – 3 μmÉxx%µýÍÇbbs.3c3t.com\Ö}.
| 小面积上的成像与元素组成；缺陷处元素的识别/绘图；颗粒分析（>300nm）Éxx%µýÍÇbbs.3c3t.com\Ö}.
|
显微红外显微镜（FTIR）Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 红外线吸收Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 分子群Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 0.1 - 1 wt%Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 0.1 - 2.5 µmÉxx%µýÍÇbbs.3c3t.com\Ö}.
| 污染物分析中识别有机化合物的分子结构Éxx%µýÍÇbbs.3c3t.com\Ö}.
识别有机颗粒、粉末、薄膜及液体（材料识别）Éxx%µýÍÇbbs.3c3t.com\Ö}.
量化硅中氧和氢以及氮化硅晶圆中的氢 （Si-H vs. N-H）Éxx%µýÍÇbbs.3c3t.com\Ö}.
污染物分析（析取、除过气的产品，残余物）Éxx%µýÍÇbbs.3c3t.com\Ö}.
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拉曼光谱（Raman）Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 拉曼散射Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 化学及分子键联资料Éxx%µýÍÇbbs.3c3t.com\Ö}.
| >=1 wt%Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 共焦模式Éxx%µýÍÇbbs.3c3t.com\Ö}.
1到5 µmÉxx%µýÍÇbbs.3c3t.com\Ö}.
| 为污染物分析、材料分类以及张力力测量而识别有机和无机化合物的分子结构Éxx%µýÍÇbbs.3c3t.com\Ö}.
拉曼，碳层特征 （石墨、金刚石 ）Éxx%µýÍÇbbs.3c3t.com\Ö}.
非共价键联压焊(复合体、金属键联)Éxx%µýÍÇbbs.3c3t.com\Ö}.
定位(随机v. 有组织的结构)Éxx%µýÍÇbbs.3c3t.com\Ö}.
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俄歇电子能谱仪（AES）Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 来自表面附近的Auger电子Éxx%µýÍÇbbs.3c3t.com\Ö}.
| Li-UÉxx%µýÍÇbbs.3c3t.com\Ö}.
| 0.1-1%亚单层Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 20 – 200 Ǻ侧面分布模式Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 缺陷分析；颗粒分析；表面分析；小面积深度剖面；薄膜成分分析Éxx%µýÍÇbbs.3c3t.com\Ö}.
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X射线光电子能谱仪（XPS）Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 来自表面原子附近的光电子Éxx%µýÍÇbbs.3c3t.com\Ö}.
| Li-U化学键联信息Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 0.01 - 1 at% sub-monolayerÉxx%µýÍÇbbs.3c3t.com\Ö}.
| 20 - 200 Å（剖析模式）Éxx%µýÍÇbbs.3c3t.com\Ö}.
10 - 100 Å (表面分析）Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 有机材料、无机材料、污点、残留物的表面分析Éxx%µýÍÇbbs.3c3t.com\Ö}.
测量表面成分及化学状态信息Éxx%µýÍÇbbs.3c3t.com\Ö}.
薄膜成份的深度剖面Éxx%µýÍÇbbs.3c3t.com\Ö}.
硅 氧氮化物厚度和测量剂量Éxx%µýÍÇbbs.3c3t.com\Ö}.
薄膜氧化物厚度测量（SiO2, Al2O3 等.）Éxx%µýÍÇbbs.3c3t.com\Ö}.
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飞行时间二次离子质谱仪（TOF-SIMS）Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 分子和元素种类Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 整个周期表，加分子种类Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 107 - 1010at/cm2 sub-monolayerÉxx%µýÍÇbbs.3c3t.com\Ö}.
| 1 - 3 monolayers (Static mode)Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 有机材料和无机材料的表面微量分析Éxx%µýÍÇbbs.3c3t.com\Ö}.
来自表面的大量光谱Éxx%µýÍÇbbs.3c3t.com\Ö}.
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| 塑料表面白色粉末成分分析Éxx%µýÍÇbbs.3c3t.com\Ö}. Éxx%µýÍÇbbs.3c3t.com\Ö}.
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