仪器名称Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 信号检测Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 元素测定Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 检测限Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 深度分辨率Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 适用范围Éxx%µýÍÇbbs.3c3t.com\Ö}.
|
扫描电子显微镜(SEM)Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 二次及背向散射电子&X射线Éxx%µýÍÇbbs.3c3t.com\Ö}.
| B-U (EDS mode)Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 0.1 - 1 at%Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 0.5 - 3 µm (EDS)Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 高辨析率成像Éxx%µýÍÇbbs.3c3t.com\Ö}. 元素微观分析及颗粒特征化描述Éxx%µýÍÇbbs.3c3t.com\Ö}.
|
X射线能谱仪(EDS)Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 二次背向散射电子&X射线Éxx%µýÍÇbbs.3c3t.com\Ö}.
| B-UÉxx%µýÍÇbbs.3c3t.com\Ö}.
| 0.1 – 1 at%Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 0.5 – 3 μmÉxx%µýÍÇbbs.3c3t.com\Ö}.
| 小面积上的成像与元素组成;缺陷处元素的识别/绘图;颗粒分析(>300nm)Éxx%µýÍÇbbs.3c3t.com\Ö}.
|
显微红外显微镜(FTIR)Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 红外线吸收Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 分子群Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 0.1 - 1 wt%Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 0.1 - 2.5 µmÉxx%µýÍÇbbs.3c3t.com\Ö}.
| 污染物分析中识别有机化合物的分子结构Éxx%µýÍÇbbs.3c3t.com\Ö}. 识别有机颗粒、粉末、薄膜及液体(材料识别)Éxx%µýÍÇbbs.3c3t.com\Ö}. 量化硅中氧和氢以及氮化硅晶圆中的氢 (Si-H vs. N-H)Éxx%µýÍÇbbs.3c3t.com\Ö}. 污染物分析(析取、除过气的产品,残余物)Éxx%µýÍÇbbs.3c3t.com\Ö}.
|
拉曼光谱(Raman)Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 拉曼散射Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 化学及分子键联资料Éxx%µýÍÇbbs.3c3t.com\Ö}.
| >=1 wt%Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 共焦模式Éxx%µýÍÇbbs.3c3t.com\Ö}. 1到5 µmÉxx%µýÍÇbbs.3c3t.com\Ö}.
| 为污染物分析、材料分类以及张力力测量而识别有机和无机化合物的分子结构Éxx%µýÍÇbbs.3c3t.com\Ö}. 拉曼,碳层特征 (石墨、金刚石 )Éxx%µýÍÇbbs.3c3t.com\Ö}. 非共价键联压焊(复合体、金属键联)Éxx%µýÍÇbbs.3c3t.com\Ö}. 定位(随机v. 有组织的结构)Éxx%µýÍÇbbs.3c3t.com\Ö}.
|
俄歇电子能谱仪(AES)Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 来自表面附近的Auger电子Éxx%µýÍÇbbs.3c3t.com\Ö}.
| Li-UÉxx%µýÍÇbbs.3c3t.com\Ö}.
| 0.1-1%亚单层Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 20 – 200 Ǻ侧面分布模式Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 缺陷分析;颗粒分析;表面分析;小面积深度剖面;薄膜成分分析Éxx%µýÍÇbbs.3c3t.com\Ö}.
|
X射线光电子能谱仪(XPS)Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 来自表面原子附近的光电子Éxx%µýÍÇbbs.3c3t.com\Ö}.
| Li-U化学键联信息Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 0.01 - 1 at% sub-monolayerÉxx%µýÍÇbbs.3c3t.com\Ö}.
| 20 - 200 Å(剖析模式)Éxx%µýÍÇbbs.3c3t.com\Ö}. 10 - 100 Å (表面分析)Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 有机材料、无机材料、污点、残留物的表面分析Éxx%µýÍÇbbs.3c3t.com\Ö}. 测量表面成分及化学状态信息Éxx%µýÍÇbbs.3c3t.com\Ö}. 薄膜成份的深度剖面Éxx%µýÍÇbbs.3c3t.com\Ö}. 硅 氧氮化物厚度和测量剂量Éxx%µýÍÇbbs.3c3t.com\Ö}. 薄膜氧化物厚度测量(SiO2, Al2O3 等.)Éxx%µýÍÇbbs.3c3t.com\Ö}.
|
飞行时间二次离子质谱仪(TOF-SIMS)Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 分子和元素种类Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 整个周期表,加分子种类Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 107 - 1010at/cm2 sub-monolayerÉxx%µýÍÇbbs.3c3t.com\Ö}.
| 1 - 3 monolayers (Static mode)Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 有机材料和无机材料的表面微量分析Éxx%µýÍÇbbs.3c3t.com\Ö}. 来自表面的大量光谱Éxx%µýÍÇbbs.3c3t.com\Ö}. 表面离子成像Éxx%µýÍÇbbs.3c3t.com\Ö}.
|
Éxx%µýÍÇbbs.3c3t.com\Ö}.
| Éxx%µýÍÇbbs.3c3t.com\Ö}. Éxx%µýÍÇbbs.3c3t.com\Ö}.
|
塑料断口红色颗粒物分析Éxx%µýÍÇbbs.3c3t.com\Ö}. Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 塑料表面白色粉末成分分析Éxx%µýÍÇbbs.3c3t.com\Ö}. Éxx%µýÍÇbbs.3c3t.com\Ö}.
|
Éxx%µýÍÇbbs.3c3t.com\Ö}.
| Éxx%µýÍÇbbs.3c3t.com\Ö}. Éxx%µýÍÇbbs.3c3t.com\Ö}.
|
连接端子pin针表面异物分析Éxx%µýÍÇbbs.3c3t.com\Ö}. Éxx%µýÍÇbbs.3c3t.com\Ö}.
| 金手指端部表面异物分析Éxx%µýÍÇbbs.3c3t.com\Ö}. Éxx%µýÍÇbbs.3c3t.com\Ö}.
|
Éxx%µýÍÇbbs.3c3t.com\Ö}.
| Éxx%µýÍÇbbs.3c3t.com\Ö}. Éxx%µýÍÇbbs.3c3t.com\Ö}.
|
镀金管脚表面异物分析Éxx%µýÍÇbbs.3c3t.com\Ö}. Éxx%µýÍÇbbs.3c3t.com\Ö}.
|
Éxx%µýÍÇbbs.3c3t.com\Ö}.
| Éxx%µýÍÇbbs.3c3t.com\Ö}. Éxx%µýÍÇbbs.3c3t.com\Ö}.
|
PCB表面异物成分分析Éxx%µýÍÇbbs.3c3t.com\Ö}. Éxx%µýÍÇbbs.3c3t.com\Ö}.
|